EMC – Electron Microscopy Center , Stockholm
Department of Materials and Environmental Chemistry (MMK), Stockholm University.
Director: Prof Gunnar Svensson
a) Research areas: The electron microscopy at EMC at Stockholm University (SU) has a long tradition as a major technique used by our research groups in materials chemistry/science. We collaborate with environmental science at Stockholm University in the study of small particles in air. In addition to morphology and crystallography, quantitative EELS is used to obtain electronic and structural information. We also support a number of groups in the University and KTH, including Biology, Organic Chemistry, Physics, Petrology, Geology etc. In these studies, high-resolution transmission and high-resolution scanning electron microscopy play an important role. We collaborate closely with the Berzelii Center EXSELENT, which fous on porous materials.
b) Strongpoint areas: For more than 30 years there has been a strong focus on elucidating/determing the structure and composition of materials at different length scales ranging from atomic to micrometer. This demand has lead to development of new techniques and knowledge in how to solve unknown crystal structures using high-resolution electron microscopy and electron diffraction. The research in this field at MMK is world leading. Another, strong point at EMC is the close collaboration between the inorganic materials chemists/scientists at SU as well as other universities (KTH, Umeå, Luleå) and their challenges. We are presently developing new techniques as
Automated 3D electron diffraction tomography to collecting continuous series of ED patterns to be used in structural refinements.
3D atomic structure reconstruction from HRTEM images. It can reveal the complete 3D atomic structure of nano-particles including interior, surface and defects.
High-resolution scanning electron microscopy (HRSEM) emphasising low landing energies and advanced sample preparation; researchers at MMK have been able to produce extremely high resolution images without charging and beam-damage problems. It allows us to extracting nanoscopic information from both surface and inside of nano- porous materials.